ELECTRON MICROSCOPY
electron microscopy: translation
Any form of microscopy in which the interactions of electrons with the specimens are used to provide information about the fine structure of that specimen. In transmission electron microscopy (TEM) the diffraction and adsorption of electrons as the electron beam passes normally through the specimen is imaged to provide information on the specimen. In scanning electron microscopy (SEM) an electron beam falls at a non-normal angle on the specimen and the image is derived from the scattered and reflected electrons. Secondary X-rays generated by the interaction of electrons with various elements in the specimen may be used for electron microprobe analysis.